JCMwave's products rely on fundamental concepts in mathematics and computer science. This results in exceptionally short computation times and compact data space requirements. These features allow our customers to obtain precise results and to avoid unappropriate problem approximations.
Application Areas:
- Frequency Domain Light Scattering
- Mask Design for Photolithography (DUV, EUV)
- Integrated Optics
- Scatterometry, Optical Metrology
- Gratings, Coatings
- Fiber-to-Chip Coupling
- Transmission and Reflection of Waveguides, Microlenses,
Micromirrors and other Obstacles in Optics and Microwave Technology
- Meta Materials, Integrated Optics, Nano-Optics
- Guided / Leaky Mode Analysis
- Optical Fibers, Photonic Crystal Fibers
- Integrated Optical Waveguides
- Plasmonic Waveguides
- Microstrip Lines, Coaxial cables including loss analysis
- Resonance Modes
- Microcavities, Microlaser Modes, VCSEL
- Photonic Bandgap Computation
James Clerk Maxwell's initials
are part of our company's name.
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All rights reserved, JCMwave GmbH, 2007. JCMwave GmbH, Haarer Str. 14a, D-85640 Putzbrunn, Germany, Tel.: +49(0)89 460 65 68, Fax: +49 (0)89 2555 132 369 |
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